3D X-RAY MEASUREMENTS FOR QUALITY ASSURANCE ZEISS METROTOM
The number of industrial applications of Computed Tomography (CT) is large and rapidly increasing. After a brief market overview, with having a numerous and different application from the manufacturing industry as well as from other industries, e.g. electrical and electronic devices, inhomogeneous materials, and from the food industry.
Industrial Computed Tomography with ZEISS METROTOM
With an industrial computer tomography system from ZEISS, you can successfully perform measuring and inspection jobs yourself with only one X-ray scan. The standard acceptance test, the precision engineering, and the sophisticated calibration process ensure the traceability of the system. Linear guideways and a rotary table meet customers' highest demands for precision.
Perform easy measurements with ZEISS METROTOM
Measuring and inspecting complete components
The ZEISS METROTOM is an industrial computer tomograph for measuring and inspecting complete components made of plastic or light metal. With traditional measuring technology, hidden structures can only be inspected after the time-consuming process of destroying the component layer-by-layer.
Measure a lot of characteristics easily and precisely
With ZEISS METROTOM computed tomography system, numerous component characteristics are scanned in one run. The resulting measurements are precise and traceable. Unlike contact measuring methods, ZEISS METROTOM is significantly faster when capturing numerous measuring points.
Intuitive handling with easy machine software
Following a short training course on how to use the ZEISS METROTOM OS machine software, the operator can select tomograph components and look into the interior of the component. With ZEISS CALYPSO you can evaluate the CT data, and with ZEISS PiWeb, they can be merged quickly in a single measurement report.
3D X-RAY MEASUREMENT APPLICATIONS
- Measuring and inspecting hidden structures non-destructively
- Complete 3D capture of a work piece, makes it possible to compare CAD models
- Destruction free defect analysis
- Easily measure the unseen